用X线衍射线形分析测定晶粒尺寸及微畸变的傅立叶级数合成方法

A Fourier Synthesis Method of X-Ray Diffraction Profile Analysis for Determination of Grain Size and Microdistortion

摘要: 本文提出了一个采用傅立叶级数合成方法分析X射线衍射线形来确定金属多晶体中晶块尺寸及微畸变的方法。与现存的其它方法相比较,这一方法所做的假设是最少的。

Abstract: This article put forward a Fourier synthesis method of X-ray diffraction profile analysis for determination of grain size and microdistor-tion. Comparing with the, other existing methods, the hypotheses applied in this method is minimum.