Abstract: The electrochemical properties of passivation film on 316L stainless steel were investigated by electrochemical impedance spectroscopy (EIS), Mott-Schottky analysis and cyclic voltammetry graph under the corresponding conditions. The result shows that passivation film on 316L stainless steel is steady in 60% acetic acid solution from 25℃ to 85℃, the polarization resistance decreased but the interface capacitance increased with increasing temperature. There is no obvious relation between temperature and semiconductor intrinsic properties. The passivation film represents the n-semiconductor characteristic in the potential interval of -0.5-0.1 V, the p-semiconductor characteristic in the potential interval of 0.1-0.9 V, and the n-semiconductor characteristic in the potential interval of 0.9-1.1 V. The graph of cyclic voltammetry shows that when the temperature is lower than 55℃ the passivation film's structure is more steady, when the temperature is 55℃ its stability tends to worsen and when the temperature exceed 55℃ its stability declines.