强紫外地区复合绝缘子理化特性分析及分子动力学模拟

Physicochemical Properties Analysis and Molecular Dynamics Simulation of Composite Insulators in High-Intensity UV Region

  • 摘要: 高海拔地区强紫外辐射蕴藏的能量足以改变硅橡胶分子结构,导致复合绝缘子发生严重的老化现象,易引发绝缘失效。而现有研究鲜有涉及强紫外地区复合绝缘子理化特性的分析。因此,本文选取典型的高海拔强紫外地区即青海地区和紫外辐射较弱的山东地区挂网运行不同年限的绝缘子为研究对象,对比分析紫外老化对绝缘子理化特性、电气性能的影响,并通过分子动力学模拟对Si-O-Si键的断裂机制进行了探究。结果表明:强紫外地区Si-(CH3)2、C-H in (CH3)及Si-CH3基团含量均随运行年限增加呈下降趋势,而Si-O-Si基团因在不同阶段氧化交联与断裂过程主导地位不同,导致其含量随运行年限增加呈先增大后降低的趋势。与青海地区不同,山东地区各基团含量均随年限增加而下降。强紫外辐射加速绝缘子甲基流失及表面无机化进程,导致青海地区静态接触角降幅达22.1%,而山东地区降幅仅为6.3%。分子动力学模拟结果表明,绝缘子放电产生的高温会加剧硅橡胶裂解,在电场与温度的作用下,Si-O-Si键能改变,当键能低于427 kJ·mol-1时,紫外辐射导致Si-O-Si键断裂。

     

    Abstract: The energy contained in intense ultraviolet (UV) radiation in high-altitude regions is sufficient to alter the molecular structure of silicone rubber, leading to severe aging phenomena in composite insulators, thereby, increasing susceptibility to insulation failure. However, existing studies rarely address the physicochemical characteristics of composite insulators in strong UV environments. Moreover, the stochastic variability of meteorological parameters in natural environments differs from the fixed parameters in laboratory settings, leading to significant discrepancies between UV radiation aging patterns observed in controlled experiments and those occurring under natural conditions. Therefore, the insulators deployed in the power grid for varying durations from two distinct regions, namely, Qinghai Province (a typical high-altitude area with strong UV radiation) and Shandong Province (a region with relatively weak UV radiation), were selected as research subjects in the current research. Through comparative analysis, the impact of UV aging on the physicochemical properties and electrical performance of the insulators were investigated. Additionally, molecular dynamics simulations were employed to explore the cleavage mechanism of Si-O-Si bond. The results indicate that in high-UV regions, the contents of Si-(CH3)2, C-H in (CH3) and Si-CH3 groups all exhibit decreasing trends with increasing operational duration. However, the Si-O-Si content shows a biphasic pattern, that is, initially increasing and then decreasing with operational duration, due to the varying dominance of oxidative crosslinking and cleavage processes at different stages. In contrast to Qinghai Province, all group contents in Shandong Province decrease with operational duration. Concurrently, with increasing operational duration, the O/Si atomic ratio of composite insulators in Qinghai Province rises from 1.19 to 1.37, while the contents of Si(-O)3 and Si(-O)4 groups increase from 23.48% and 11.50% to 58.84% and 21.75%, respectively. Under the same operational duration, the insulators in Qinghai Province exhibit higher O/Si ratios and greater Si(-O)3 and Si(-O)4 contents than those in Shandong Province. These findings indicate that intense UV radiation accelerates methyl group loss and surface inorganic transformation processes. Consequently, the static contact angle of the insulators in Qinghai Province decreased by 22.1%, compared to only 6.3% in Shandong Province. With increasing operational duration, silicone rubber crosslinking structures of composite insulators in both regions are damaged, accompanied by surface morphological deterioration. This damage introduces physical and chemical traps on the surface, leading to a decrease in flashover voltage. In Shandong Province, the crosslinking structures of the insulator shed exhibit more severe damage, resulting in a higher density of physical traps. The increased accumulation of the charges on the insulator surface caused a greater disruption to electric field uniformity compared to the insulators in Qinghai Province. Consequently, under the same operational duration, the insulators in Shandong Province demonstrate lower flashover voltages than those in Qinghai Province. Molecular dynamics simulation results reveal that the high temperatures generated by insulator discharges exacerbate silicone rubber pyrolysis. Under the combined effects of electric field and temperature, alterations in Si-O-Si bond energy occur. When the bond energy drops below 427 kJ·mol-1, UV radiation induces the cleavage of Si-O-Si bond. The research findings present in this paper provide theoretical support for the aging assessment and operational maintenance of composite insulators in strong UV regions.

     

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